| Principle
of operation |
| Bragg’s law of X-ray
diffraction |
| Capability |
- Recording of X-ray diffractograms
over a wide 2? range upto 168? with a resolution of 0.0002? and wide scan
rate in the range of 0.001 to 800?/min
- High temperature facilities
/ attachment allows to analyze the samples in the temperature range of
25 to 1500 C; ideal for phase and crystallographic transition analysis
- Facilitates:
(a) Structural
characterization of crystalline materials
(b) Confirmation/detection
& characterization of phases in materials
(c) Particle size
analysis through line broadening
(d) Determination
of surface residual stress
(e) Recording of
spectra for thin film samples
|
| Sample
detail |
| Samples for analysis
should be either in powder, pellet or thin sheet form. The minimum
quantity of powder samples is 2 gm. |
| |
